Frances Allen
UC Berkeley
Harnessing Charged Particle Beams to Tailor Defects by Design
The helium ion microscope has emerged as a multifaceted instrument enabling a broad range of applications beyond imaging in which the finely focused helium ion beam is used for a variety of defect engineering, ion implantation, and nanofabrication tasks. This talk will focus on discussing the many defect engineering applications.
About Frances Allen
Dr. Frances Allen is an electron and ion beam microscopist at UC Berkeley. She obtained an M.Sci. in Chemistry and Physics in the UK and a PhD in atomic physics and X-ray spectroscopy in Germany. Subsequently she came to Lawrence Berkeley National Laboratory for a postdoc in analytical electron microscopy. In her current role as a research scientist at UC Berkeley’s QB3 Biomolecular Nanotechnology Center, Frances leads research centered on microscopy, spectroscopy and nanofabrication using advanced electron and ion beam microscopes.
