Invited Speaker
Adam Steele
zeroK NanoTech
Ion Microscopy, Machining, and Elemental Analysis with the Cesium Low Temperature Ion Source (LoTIS)
Authors: Adam Steele, Andrew Schwarzkopf and Brenton Knuffman
We present results from focused ion beam and elemental analysis instruments featuring the Cs+ Low Temperature Ion Source (LoTIS). These systems can deliver the highest precision nano machining and the highest-resolution SIMS elemental maps.
Invited Speakers
Owen Medeiros
Multilayer Superconducting Fabrication Process for Microwave and Digital Electronics
View Abstract
Michael Cullinan
Microscale Additive Manufacturing of Metal Interconnects Using Microscale Selective Laser Sintering
View Abstract