Jiawei Zuo
Chip-Integrated Full-Stokes Polarimetric Imaging Sensor
Ion Microscopy, Machining, and Elemental Analysis with the Cesium Low Temperature Ion Source (LoTIS)
Boring Beads or Surprising Standards? A Lateral Nanoflow Assay Reveals Flummoxing Fluorescence
High-Throughput Patterning of Sub-Diffraction 3D Structures Through Projection of Femtosecond Light
Trilayer Process for T-gate and Gamma-gate Lithography Using Ternary Developer and Proximity Effect Correction Superposition