Invited Speaker

Adam Steele

zeroK NanoTech

Ion Microscopy, Machining, and Elemental Analysis with the Cesium Low Temperature Ion Source (LoTIS)

Authors: Adam Steele, Andrew Schwarzkopf and Brenton Knuffman

We present results from focused ion beam and elemental analysis instruments featuring the Cs+ Low Temperature Ion Source (LoTIS). These systems can deliver the highest precision nano machining and the highest-resolution SIMS elemental maps.

Ion Microscopy, Machining, and Elemental Analysis with the Cesium Low Temperature Ion Source (LoTIS)

Session 1A-1: Advanced Ion Beam Technologies
Date: Wednesday, June 1
Time: 1:20 pm
Location: Napoleon B

Invited Speakers

Maxim Zalalutdinov

Coherent Acoustic Phonons in 2D Layered Materials

View Abstract

Owen Medeiros

Multilayer Superconducting Fabrication Process for Microwave and Digital Electronics

View Abstract

Saba Ghassemi

A Novel Microfluidic Device for Rapidly Generating Potent CAR T Cells

View Abstract