Max Yuan
University of Alberta in Edmonton Canada
Electronic characterization of different atomically precise dangling bond wires on H-Si (100)
Using scanning tunneling microscopy and spectroscopy, six different types of dangling bond wires were perfectly fabricated, and electronically characterized with previously unavailable consistency and precision. Density functional theory was employed to complement the experimental data and calculate transmission coefficients for the wires to determine their prospects for future devices.
About Max Yuan
Max Yuan is a PhD candidate under professor Robert Wolkow at the University of Alberta in Edmonton Canada. For the past decade, the Wolkow group has pushed the boundaries of atom scale fabrication, imaging techniques, and dynamic charge sensing of single surface atoms and dopants. His current doctoral work focuses on the atomically precise manufacturing and characterization of atomic circuitry components with the eventual goal of developing practical atom scale devices. In this research he uses scanning probe microscopy techniques to place and measure individual atoms on the silicon surface, routinely making atomically precise and error free structures of well over 100 atoms. In addition to this, he has collaborated with academia and industry as an associate at the National Research Council of Canada, the National Institute of Standards and Technology, and Quantum Silicon Inc. Before joining the University of Alberta he previously studied and conducted research under Dr. Mark Gallagher and Dr. Alla Reznik at Lakehead university (2019).
