Conference

David S. Bergsman

Assistant Professor, Department of Chemical Engineering, University of Washington

Use of High Throughput MLD to Screen Photoresist Chemistries for EUV Lithography

David S. Bergsman
Dan Congreve

Dan Congreve

Electrical Engineering, Stanford University
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Luca Basso

Luca Basso

Researcher at the Center for Integrated Nanotechnologies, Sandia National Labs
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Uros Jagodic

Uroš Jagodič

Research Scientist, Jožef Stefan Institute, Slovenia
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Sourabh K. Saha

Sourabh K. Saha

Assistant Professor and Woodruff Faculty Fellow, George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology
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