Conference

David S. Bergsman

Assistant Professor, Department of Chemical Engineering, University of Washington

Use of High Throughput MLD to Screen Photoresist Chemistries for EUV Lithography

David S. Bergsman
Anuja De Silva

Anuja De Silva

Technical Director at Lam Research 
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Michael Tsapatsis

Michael Tsapatsis

Bloomberg Distinguished Professor, Department of Chemical and Biomolecular Engineering, John Hopkins University
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Julia W. P. Hsu

Julia W.P. Hsu

Texas Instruments Distinguished Chair in Nanoelectronics, Department of Materials Science and Engineering, University of Texas at Dallas
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Danilo De Simone

Danilo De Simone

Scientific Director at imec
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