Lucille A. Giannuzzi
TESCAN USA, Inc.
Focused Ion Beam Specimen Preparation Methods for Scanning/Transmission Electron Microscopy
The use of dual platform focused ion beam (FIB) scanning electron microscopy (FIB SEM) for preparation of scanning/transmission electron microscopy (S/TEM) specimens is now ubiquitous. Both speed and quality have improved over the years as FIB instruments advance in resolution with the ability to offer different ion species at a range of ion energy. Use of artificial intelligence allows for unattended and FIB automation. We will cover the basics of FIB theory and discuss techniques and methods used to prepare quality S/TEM specimens.
About Lucille A. Giannuzzi
Lucille A. Giannuzzi holds a B.E. in Engineering Science and M.S. in Materials Science and Engineering from Stony Brook University. She received her Ph.D. from Penn State in Metals Science and Engineering. Giannuzzi was a faculty member at the University of Central Florida for ten years where she was a recipient of an NSF CAREER award. She joined FEI Company (now Thermal Fisher Scientific) as a product marketing engineer for seven years before founding her own consulting and product companies. As founder and President of EXpressLO LLC, Giannuzzi secured Phase I/II DOE SBIR funding to develop cryogenic specimen manipulation methods. In 2024, TESCAN GROUP acquired EXpressLO, and Giannuzzi is now full time with TESCAN USA, Inc. as Business Development Manager. Giannuzzi has applied focused ion beam and electron microscopy techniques to study the structure/property relationships in metals, alloys, ceramics, composites, polymers, minerals, bone/dental implants, irradiated, inorganic, and biological materials. Giannuzzi has over 150 (co)authored publications; several FIB-related patents, contributed to several invited book chapters, and is co-editor of a book entitled “Introduction to Focused Ion Beams.”
